Single MoOx film, and the mixed one with only 8% MoOx have the highest value of refractive index, and similar dispersion in the visible spectral range. Ellipsometric data for the optical constants show dependence on the amount of MoOx in the chemical composition. Cyclic voltammograms were recorded with a scan rate of 5 mV s⁻¹. Films of WO3 and of mixed W- Mo oxide with three compositions showed coloring and bleaching under the application of a small voltage. Newly acquired equipment was used to study optical spectra, optoelectronic properties, and film structure. Film thicknesses were around 300 nm as determined by surface profilometry. The substrates were 5×5 cm² plates of unheated glass pre-coated with ITO having a resistance of 40 ohm/sq. W and Mo targets (5 cm diameter) and various oxygen gas flows were employed to prepare samples with different properties, whereas the gas pressure was kept constant at about 30 mTorr. Thin film deposition by reactive DC magnetron sputtering was performed at the Ångström Laboratory.
Poliester en aerosol kromatik series#
Thin metal oxide films were investigated by a series of characterization techniques including impedance spectroscopy, spectroscopic ellipsometry, Raman spectroscopy, and Atomic Force Microscopy. This superior EC stability make this novel bilayer structure promising for future commercial application in high quality EC devices. As a comparison, under the same optical wavelength, the sample without ZTO buffer layer had a Tc range from 3.1% to 21.4% and ΔT variation from 80.0% to 65.3%. After 2000 electrochemical cycles, there was a little change in Tc, ranged from 3.6% to 8.7% (at 790 nm), and the related ΔT variation was only from 78.6% to 76.8% (at 790 nm). It was found that the introduction of ZTO buffer layer maintained a stable nano-column structure and prevented a structural degradation during the harsh Li⁺ insertion/extraction in EC process, and then restrained the deterioration in colored transmittance (Tc) and optical modulation (ΔT). In this primary work, a ZTO layer with a thickness of 18 nm was radio frequency (RF) sputtered on the surface of 300 nm thick tungsten oxide film, and the corresponding characterizations on composition, structure and EC performance were carried out by XPS, XRD, SEM and electrochemical analysis. Herein, we firstly reveal the feasibility that amorphous zinc tin oxide (ZTO) can be employed as buffer layer to improve the cyclic stability for the room-temperature sputtered tungsten oxide electrochromic (EC) film on flexible PET substrate.
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